Analysis of adhesive penetration into wood using nano-x-ray computed tomography

Paige McKinley; Frederick A. Kamke; Arijit Sinha; Vincent De Andrade; Joseph Jakes

Treesearch

Analysis of adhesive penetration into wood using nano-x-ray computed tomography

Formally Refereed

Authors:

Paige McKinley, Frederick A. Kamke, Arijit Sinha, Vincent De Andrade, Joseph Jakes

Year:

2018

Type:

Scientific Journal

Station:

Forest Products Laboratory

Source:

Wood and Fiber Science. 50(1): 66-76.

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Abstract

This study focused on the penetration of adhesive into cell lumens and cell walls. Douglas-fir samples containing an iodinated phenol-formaldehyde adhesive were analyzed using nano-X-ray computed tomography (XCT), X-ray fluorescence microscopy, and energy-dispersive X-ray spectroscopy to observe adhesive penetration in cell walls. A gradient of penetration was observed within the cell wall structure. In addition, these nano-XCT datasets were indexed to previous micro-XCT datasets, which gave the ability to link the nanoscale cell wall penetration to microscale penetration in to the porous network of cell lumens.

Keywords

Nano-X-ray computed tomography, X-ray fluorescence microscopy, energy-dispersive X-ray spectroscopy, adhesive, cell wall penetration

Citation

McKinley, Paige; Kamke, Frederick A.; Sinha, Arijit; De Andrade, Vincent; Jakes, Joseph E. 2018. Analysis of adhesive penetration into wood using nano-x-ray computed tomography. Wood and Fiber Science. 50(1): 66-76.